13:45 - 14:00 Maximilian Lipp (ARCNL)
Deep Learning for robust optical metrology in semiconductor device manufacturing |
14:00 - 14:15 Monika Molnar (Delft University of Technology)
Signal Saturation in High Dose Local Irradiation of YAG:Ce Scintillators |
14:15 - 14:30 Norman Blümel (Leiden University)
Towards closing the gap with operando high temperature scanning tunnelling microscopy |
14:30 - 14:35 Poster pitches |
14:35 - 14:50 Niels de Vries (Delft University of Technology)
Having the cake and eating it too: high-resolution high-throughput SEM |
14:50 - 15:05 Simona Borrelli (Leiden University)
High-Throughput UV-Laser-Based Photo Electron Emission Microscopy of Brain Tissue |
