Parallel session

Thin Films, Fabrication, Characterisation & Optimization

Parkzaal

Chair: tbd

16:35 - 16:50

Timur Terentev (University of Twente)
High resolution atomic depth profile reconstruction for short-period multilayers

16:50 - 17:05

Arash Tebyani (Delft University of Technology)
Visualizing electron beam induced charge migration in thin films

17:05 - 17:20

Arthur van der Sar (University of Twente)
Ion-Beam Engineering of Ultrashort-Period Cr/Sc Multilayers

17:20 - 17:35

Lars Sonneveld (AMOLF)
Closed-Loop Perovskite Optimization via High-Throughput Optical Proxy Metrics